|DDR Hardening Demystified|
Meet your design requirements when integrating complex DDR memory interfaces by analyzing and fine-tuning the design parameters through an automated hardening flow that iteratively refines the implementation.
Jul 11, 2014
|FPGA-based Prototyping to Validate the Integration of IP into an SoC|
This case study looks at some of the challenges and solutions you may face in integrating and validating USB interface IP within your SoC design and how to use FPGA-based prototyping to validate your system.
Oct 23, 2013
|Hierarchical physical design - issues and methodologies|
In this paper, we will examine some of the issues and methodologies encountered during the finishing and physical signoff stages, and discuss how some of the risks can be mitigated by forward planning and careful data management based on successful experiences of Synopsys Professional Services design consultants implementing large designs. We will also look at additional methods that can be used to give a high degree of confidence in the integrity and manufacturability of a large hierarchical design.
Jul 12, 2013
|More Than Data Management|
Managing the people, the data and the technology are just as important as meeting the market window given that without these, the entire project wouldn't function. Throw huge data set sizes, different cultures and business management issues into the mix and the challenges are many.
Mar 28, 2013
Glenn Dukes, Vice President of Synopsys Professional Services, suggests that the right combination of program management expertise, infrastructure support and soft skills enables design teams to reap the growth benefits of global design.
Synopsys Journal, Issue 1 2012
Apr 01, 2012
|Semi ecosystem collaboration more critical than ever|
With the industry still recovering from the recession, design tool and methodology innovation is continuing to shift to tight collaboration between semiconductor companies, EDA vendors, and foundries.
Mar 02, 2010
|Complex SoC Testing with a Core-Based DFT Strategy|
With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it reaches manufacturing. But, using a core-based test strategy combined with scan compression offers one of the most effective ways to limit both huge data volumes and high power consumption of complex SoC tests.
Feb 26, 2008
|Applying Constrained-Random Verification to Microprocessors|
Constrained-random verification (CRV) offers a highly effective way to deal with the challenges of microprocessor verification. These verification challenges are overwhelming for many reasons: complex instruction sets, multiple pipeline stages, in-order or out-of-order execution strategies, instruction parallelism, fixed- and floating-point scalar/vector operations, and other features that create a seemly never-ending list of corner cases to exercise. The time required to create traditional directed tests has become unreasonable.
Dec 10, 2007
|Practical Ways To Estimate, Implement, And Verify SoC Decoupling Capacitance|
Deep-submicron systems-on-a-chip (SoCs) require a power-grid voltage drop of much less than 10% of VDD. Decoupling capacitors, or decaps, help achieve this goal by minimizing switching noise.
Oct 25, 2007
|Delivering Simultaneous Silicon and Software|
A chip is of little use without its software. The semiconductor industry realizes this and is more interested than ever in delivering both silicon and software at the same time. Texas Instruments has combined a number of strategies to reduce software integration time from around 18 months to just one to two months.
Oct 04, 2007
|IC Design at Advanced Process Nodes: Add Flex to your Flow|
To handle numerous technical challenges associated with advanced process nodes, chip designers must have a design flow that adapts to evolving requirements and design goals. At the same time, design teams must also deal with project-related challenges, such as achieving consistent design development across geographically distributed design teams, ramping up new sites, and correcting issues with third-party-library and IP (intellectual-property) quality.
Aug 16, 2007
|Practical Power Network Synthesis For Power-Gating Designs|
Although methodologies for power network synthesis typically assume that design tools can freely size sleep transistors for power gating, this assumption does not hold up for real-world SoC designs where the sleep transistors are commonly designed as custom switch cells of fixed sizes.
Jun 05, 2007
|Proper Planning Assures SoC Power Integrity|
Unless they're planned out of the design, power integrity issues like excessive rail voltage drop (IR drop) and ground bounce can create timing problems.
Jan 01, 2007
|A Practical Approach to Measuring IC Design Productivity|
If a project goes beyond its predicted schedule, it directly impacts profitability. With this in mind, Synopsys consulting and design services organization evaluated their own physical design processes across a broad spectrum of their customer design projects to better understand how productivity can be measured and improved.
Jan 01, 2007
|Metrics Measure IC Design Productivity|
IC design productivity is often thought of as an elusive term. From a design team's perspective, it is a difficult concept to assess due to the fact that IC design projects are diverse in their input, application areas, and design approaches.
Oct 16, 2006
|Power Planning for SoCs |
Careful power planning is essential for designs targeting advanced semiconductor processes. David Stringfellow and Kevin Knapp, design consultants with Synopsys Professional Services, give guidance on best practice recommendations that can help to ensure power integrity throughout the entire design flow.
Aug 13, 2006
|A Practical Methodology Calculates IR Drop Targets for SoCs |
The shift to smaller process geometries has led to a dramatic increase in problems due to IR drop. Michael Solka and Jonathan Young, both with Synopsys Professional Services, explain how the right IR drop target should be found before steps are taken to address the problem.
Jul 13, 2006
|Consistency in Process and Measurement: Tracking Long-Term Design Productivity Gains |
For many design managers, measuring design productivity may seem more difficult than improving it. While the ability to deliver increasingly complex chips all but ensures design teams are making strides toward better design productivity, quantifying this improvement can be elusive.
Mar 13, 2006
|Pilot Design Environment Integrates Flow |
At first glance, the Pilot Design Environment from Synopsys Inc. may sound like a resurrected EDA framework from the late 1980s. But Synopsys claims to be taking a fresh approach with this integrated RTL-to-GDSII design system, sold as a customized offering by Synopsys Design Services.
Feb 27, 2006
|Dual Threshold Voltages and Power-Gating Design Flows offer Good Results |
Design-optimization methodologies and flows that use gates with two threshold voltages (VTH) can achieve excellent results for both power and timing with a high degree of automation. This dual-VTH approach has become crucial for VDSM (very-deep-submicron) chips, in which reduced VTH not only improves performance, but also increases static (leakage) power.
Feb 02, 2006
|Integrating DFM in the Design Flow |
Recent collaboration between UMC and Synopsys has resulted in a complete RTL-to-GDSII reference design flow, which now includes critical design for manufacturing features for UMC’s 90nm process.
Jan 13, 2006
|Diversifying Design Trends in North America |
From 2001-2003, there was a downturn in semiconductor markets worldwide. Many veterans of the semiconductor industry argued – at the time – that the downturn was nothing new, that the semiconductor market has always been cyclical, and it is a function of supply and demand.
May 13, 2005
|Front-End Signal Integrity Methods Save Back-End Repair Time |
Taking steps to prevent signal integrity (SI) problems can greatly reduce the number of SI errors that you have to fix after routing. Good prevention methods thus help minimize last-minute timing-closure panic due to SI issues such as crosstalk delay and noise.
Mar 13, 2005
|Take Care to Avoid Signal Integrity Problems |
Signal integrity issues such as crosstalk delay and noise are significant challenges for system-on-chip designs at 130 nanometers and below.
Jan 17, 2005