Faster and Fewer Patterns with Breakthrough ATPG to the Rescue
New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests.
Aug 10, 2016

Reducing test costs through multisite and concurrent testing
How to save test time and test costs by doing more tests in parallel, increasing compression, pooling tester memory, managing branching – and more
Nov 06, 2015

Faster ATPG and Other Test Goodies
Three recent Synopsys Test announcements...
Oct 26, 2015

Three New Things from ITC this Year
New ATPG Technology, ISO 26262-5 Certification (Auto reliability standard) and Improved support of FinFET and emerging node tests
Oct 23, 2015

Synopsys Touts New Test Technology
Synopsys chose the International Test Conference held here October 6-8 to highlight three advances in test technology.
Oct 12, 2015

New Synopsys SoC Test Features
Cell-Aware: Meet Slack-Based. And STAR: Meet eFlash.
Dec 11, 2014

New Silicon Test Technology in Synopsys' TetraMAX ATPG Increases Detection of Subtle Manufacturing Defects
Unique new slack-based cell-aware technology in TetraMAX ATPG showcased at ITC 2014 addresses subtle manufacturing defects by leveraging behavior information of defective cells simulated with Synopsys circuit simulators along with design performance data from the Synopsys PrimeTime static timing signoff solution.
Oct 20, 2014

On-Chip Instrumentation Augments ATE
A variety of hardware and software products has been introduced this year that significantly enhances semiconductor test capability.
Oct 28, 2013

Test Technology Innovation: Lowering the Cost of Quality
This article makes the case that new innovation is needed to address the DFT closure challenges as well as the test cost and test quality requirements of the next generation of SoCs. It also provides designers a glimpse into Synopsys’ new compression technology, which is optimized for pin-limited testing and supports more complex designs, higher defect coverage, and faster scan operations to lower test cost.
Jul 17, 2013

TetraMAX Small Delay Defect ATPG Boosts Test Quality at STMicroelectronics
STMicroelectronics was faced with the challenge of meeting very high corporate test quality objectives across all its product lines without increasing test costs. This challenge was made even more difficult since on-chip process variations are more pronounced in today’s manufacturing processes, resulting in more small delay defects (SDDs). Breakthrough timing-aware technology in TetraMAX automatic test pattern generation (ATPG) enabled designers at the company to use precise timing information generated by Synopsys’ PrimeTime static timing analysis, the industry’s defacto signoff solution, to quickly and easily generate patterns that target SDDs.
Jun 15, 2013

DFT strategy for ARM processor-based designs
This article provides an example of an optimized DFT architecture, referred to as “shared I/O.” It is enabled by Synopsys’ synthesis-based test solution, which has been used successfully in Samsung’s multicore processor designs. The experience demonstrates that shared I/O is a better approach than the standard DFT architecture for testing multicore designs since it reduces test costs by utilizing fewer pins while providing the same or better test time reduction.
Jan 22, 2013

20nm test demands new design-for-test and diagnostic strategies
20nm test needs new approaches to cope with short delay defects, new memory failure mechanisms and the consequences of test compression strategies.
Nov 05, 2012

The Fast Track to 3D-IC Testing
Three-dimensional integrated circuit (3D-IC) systems offer the potential to deliver significant improvements in performance, power, functional density, and form factor over other packaging integration techniques. Despite substantial progress toward realizing 3D-IC systems, a variety of design, manufacturing, packaging, and testing issues still need to be addressed before cost-effective, high-volume production can be achieved.
Jan 16, 2012

Expanding Synthesis-based Test for Higher QoR and Lower Cost
Robert Ruiz, Synopsys, explains how advanced test technology is enabling designers to achieve optimal quality of results (QoR) and eliminate time-consuming iterations between design and test, to keep pace with customers' evolving requirements.
Mar 28, 2011

Synopsys debuts DesignWare STAR ECC IP
Synopsys chose the International Test Conference to announce an expansion of its synthesis-based test technology and announced the availability of its DesignWare STAR ECC (self test and repair error-correcting codes) IP.
Nov 06, 2010

Synopsys to Expand Synthesis-Based Test Technology
Synopsys announced plans to expand test technology embedded in Synopsys' RTL synthesis to address the need for higher defect coverage, lower test cost and faster yield analysis while simultaneously minimizing the impact on design goals and project schedules.
Nov 04, 2010

Are design and test conflicting or symbiotic?”
Although design and test goals may be fundamentally different, are they in direct conflict or are they in fact symbiotic? Read to find out the answer to this question and learn why achieving better design-for-test now requires an approach based in synthesis to enable faster and more predictable results for both design and test.
Oct 08, 2010

Using compression to meet pin-limited test requirements
This article looks at the industry’s growing need to maintain high scan compression with fewer test pins, and how Wolfson Microelectronics used DFTMAX compression to meet its pin-limited test requirements.
Jan 21, 2010

Small Delay Defect Testing
Advances in Synopsys’ TetraMAX ATPG technology have made it possible for semiconductor companies to efficiently target extremely subtle nanometer defects during manufacturing test. This article describes the basic principles behind small delay defect (SDD) ATPG and presents failure statistics on hundreds of thousands of ICs manufactured at STMicroelectronics showing that TetraMAX’s SDD patterns achieve higher defect coverage than standard transition delay patterns.
Jun 01, 2009

Playing it cool
Power-aware ATPG technology controls thermal and power-rail-droop problems that can damage devices or lead to false failures during production test.
Oct 01, 2008

Optimizing Compression in Scan-based ATPG DFT Implementations
Implementing scan compression on-chip provides significant test cost savings, but how much compression is enough? This article introduces a comprehensive economic model unifying test data reduction and test time reduction principles that describes how to determine the optimal compression level for your designs.
Mar 01, 2007

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