|Xilinx and Synopsys Present: Meeting Test Goals Faster with SpyGlass DFT ADV|
Early detection of testability issues can prevent major bottlenecks downstream and avoid time-consuming design iterations. In this webinar, Synopsys presents new techniques and capabilities available in SpyGlass DFT ADV such as high-impact test points to boost coverage, reduce the number of patterns, and minimize test costs. Our guest speaker from Xilinx discusses test challenges associated with large SoC designs such as the Xilinx Zynq® UltraScale™ chip family, and illustrates how SpyGlass DFT ADV addresses testability issues early in the design flow, saving weeks of complex DFT-related ECOs.
Amit Majumdar, Principal Engineer, Xilinx; Anthony Joseph, Applications Engineer, Synopsys; Dmitry Melnik, Marketing Manager, Synopsys
Apr 28, 2016
|Increasing Verification Closure Effectiveness with Formal Verification|
Learn about Synopsys VC Formal advanced techniques and formal coverage metrics that provide better convergence and simulation-like visibility, to achieve formal verification signoff.
Prapanna Tiwari, Formal Verification Product Marketing, Synopsys; Sean Safarpour, Ph.D., Formal Verification CAE Manager, Synopsys
Apr 20, 2016
|Bridging the Gap in Mixed-Signal Debug: Introducing Synopsys' NEW Verdi Advanced AMS Debug Solution|
In this webinar, we will demonstrate how Synopsys' new Verdi Advanced AMS debug solution, based on the market-leading Verdi SoC debug platform, delivers groundbreaking co-simulation debug for both analog and digital engineers, as well as system integrators.
Archie Feng, Corporate Applications Engineer, Verification Group, Synopsys; Vaishnav Gorur, Product Marketing Manager, Verification Group, Synopsys
Mar 15, 2016
|What’s Next in Storage: NVMe Verification IP|
In this webinar, we will discuss the latest technology in storage protocols, NVMe, a rapidly evolving high performance storage standard developed to reduce latency and support parallelism.
Eric Peterson, Senior R&D Engineer, Synopsys; Paul Graykowski, Senior Corporate Application Engineer (CAE) for Verification Group, Synopsys
Feb 23, 2016
|Improving Analog Verification Productivity Using Synopsys Simulation and Analysis Environment (SAE)|
Learn about the comprehensive GUI-based transistor-level simulation and analysis environment that is deeply integrated with CustomSim, FineSim, and HSPICE circuit simulators.
Deepa Kannan, SAE Technical Marketing Manager, Synopsys
Feb 17, 2016
|Catching the Uncatchable Bugs with SpyGlass CDC: Comprehensive, Practical, and Powerful Analysis|
In this webinar, we will discuss how the SpyGlass CDC solution enables comprehensive clock and reset domain crossing (CDC/RDC) verification for more than a billion gates, helping designers to avoid costly chip killer bugs, re-spins and achieve signoff quality verification.
Kiran Vittal, Director Product Marketing, Verification Group, Synopsys; Sean O’Donohue; Senior Corporate Application Engineer (CAE), Verification Group, Synopsys
Jan 26, 2016
|Raising Design and Verification Productivity with SpyGlass Lint Advanced: The Next Generation of Lint|
In this webinar, we will discuss how the newly introduced SpyGlass Lint Advanced solution identifies RTL issues at their source, pinpoints structural, coding and consistency problems in the RTL descriptions, and helps designers resolve issues quickly before design implementation.
Arbind Kumar Rohilla, Verification Group, Synopsys
Dec 08, 2015
|A Holistic Approach to Verification: Synopsys VIP for ARM AMBA Cache Coherent Interconnects|
In this webinar, we will discuss how to take advantage of the system-level capabilities of Synopsys Verification IP for ARM® AMBA® protocols to verify cache-coherent interconnects. Synopsys VIP includes system-level interconnect test suites and system-level coverage to accelerate verification closure.
Satyapriya Acharya, Engineering Manager, Verification Group, Synopsys
Nov 18, 2015
|20X Power Analysis Performance Improvement with Synopsys Verdi Technologies|
Discover how Synopsys' Verdi technologies, Siloti Correlation and Siloti What-If Replay Simulation, can enable up to 20X performance improvement for power analysis – from weeks to hours. These technologies enable the use of RTL simulation results to generate gate-level simulation data without the need to bring up the gate-level environment, thus enabling power analysis at early stages of the design cycle. Also included is parallel run technology to enhance performance up to 60X compared to the original flow.
Rich Chang, Product Marketing Manager, Debug, Synopsys
Sep 16, 2015
|Learn How to Accelerate Verification Closure with PCIe Gen4 VIP|
This webinar shows how to leverage protocol, methodology, verification and productivity features of Synopsys VC VIP and UVM source code test suites for accelerated verification closure of PCIe Gen4 based designs.
Paul Graykowski, Senior Manager, PCIe VIP, Synopsys
Aug 19, 2015
|TSMC/Synopsys CustomSim Collaboration for 16nm FinFET Design Success|
Join TSMC and Synopsys as we discuss N16FF+/early N10 certification collaboration activities and how CustomSim 2015.06 addresses the design needs of FinFET technology nodes.
Jacob Ou, Technical Manager, TSMC; Tom Hsieh, Corporate Application Engineering Manager, Synopsys
Aug 12, 2015
|Addressing Verification Challenges of Evolving Ethernet Speeds from 25/40/50/100G and Beyond|
We will outline in detail the verification challenges of current and future Ethernet speeds and explain how Accellera UVM Methodology, IEEE 1800-2012 System Verilog Functional Coverage, and SystemVerilog Ethernet Verification IP empowers design and verification teams with methodology, techniques and tools they need to achieve success.
Shenoy Mathew, Senior Corporate Applications Engineer, Verification Group, Synopsys
May 20, 2015
|Picking up the pieces: self-contained verification platforms for the modular smartphone era|
In the framework of Mobile platforms, learn how source code testsuites provided with Verification IP enable verification engineers to quickly generate diverse permutations of random/constrained random transactions that stress test the systems and subsystems, contributing to "Shift Left" of the verification time and ensure bug free designs.
Nitin Agrawal, CAE Manager, Verification Group, Synopsys
Apr 07, 2015
|Automate Low Power Verification and Implementation Flow with VC Apps|
UPF imported into Verdi's database provides valuable information to understand relationships between logic designs to power its intent. Learn how VC Apps APIs allows users to check if the design meets the requirements of low power design rules, and helps automate the implementation of low power design structure.
Rich Chang, Product Marketing Manager, Debug, Synopsys; Paul Huang, Corporate Application Engineer (CAE), Synopsys
Jan 28, 2015
|Avoiding the Common Pitfalls of ARM-based Cache-coherent Verification and Performance Analysis|
Synopsys will cover how verification IP for AMBA enables users to generate correct and interesting coherent stimulus for cache coherent SoC verification. This will include the complexities of configuration, stimulus, coverage and checking, as well as how to address the common verification pitfalls.
Neill Mullinger, Product Marketing Manager for Verification IP, Synopsys; Tushar Mattu, Corporate Application Engineer (CAE) for Verification Group, Synopsys
Dec 03, 2014
|Take Control of Your Flow: Getting Started with Your First VC Apps|
VC Apps, a programming interface available with Verdi, provides direct and open access to information from Verdi’s databases, analysis engines, and GUI components to customize, innovate or integrate within the Verdi debug environment. Verdi users have the power to maximize their effectiveness by using pre-built VC Apps or writing custom automation apps, scripts or programs. Learn how VC Apps APIs allow users to quickly get started writing programs, and provide many valuable ready-to-use apps installed in the Verdi package.
Rich Chang, Product Marketing Manager, Debug, Synopsys; Paul Huang, Corporate Application Engineer (CAE), Synopsys
Nov 11, 2014
|HSPICE Tips & Tricks Webisode Series|
Learn from Synopsys applications engineers how to get the most out of HSPICE analysis. Topics will include how to most effectively use S-element, eye diagrams, IBIS-AMI, RUNLVL, and more. New mini webinars will premiere monthly.
Ted Mido, Principal Engineer, HSPICE R&D, Synopsys
Nov 03, 2014
|The 10 Things to Know About Memory Verification: Synopsys Memory VIP|
Learn how feature-rich, native SystemVerilog memory VIP rapidly verifies the memory interfaces on complex designs, focusing on 10 key areas where productivity is improved.
Neill Mullinger, Product Marketing Manager for Verification IP, Synopsys; Nasib Naser, PhD, Senior Staff Corporate Applications Engineer, Synopsys
Oct 23, 2014
|Reinventing Coverage and Planning with Verdi—A Fully Integrated, Complete Verification Closure Flow To Help You Deliver Chips On Time|
The Synopsys Verdi® Coverage solution provides comprehensive planning and coverage analysis technologies as a part of the industry-leading Verdi3™Automated Debug System. We'll discuss why Synopsys' native integration of planning, coverage, and debug technologies provide a complete closure solution to help meet demanding schedules and provide teams with more confidence when asked the inevitable question: '"Are we done yet?"
Steve Chappell, Senior Product Marketing Manager, Debug and Analysis, Synopsys; Michael Horn, Verification Technologist, Synopsys
Oct 14, 2014
|Addressing IP Compliance Challenges with UVM-based Test Suites|
Protocol verification is a massive time- and resource-consuming endeavor, fraught with complexity and the risk of errors and omissions. Synopsys Verification Test Suites leverage the expertise of protocol experts to provide a rapidly deployable and extensible set of comprehensive tests, written in easily modifiable and reusable SystemVerilog UVM source code. The webinar will give an overview of the architecture and scope of Synopsys’ Verification Test Suites to achieve faster and higher quality coverage closure.
Neill Mullinger, Product Marketing Manager for Verification IP, Synopsys; Karim Aoua, Staff CAE, Synopsys
Sep 30, 2014
|Advanced-Node Variability Characterization and STA Margining with SiliconSmart and PrimeTime|
Learn about the new slew-/load-dependent POCV delay model, and hear GLOBALFOUNDRIES describe their experiences using SiliconSmart and PrimeTime to implement a variation-based methodology for advanced
Dr. Tamer Ragheb, SMTS Design CAD Engineer, GLOBALFOUNDRIES; Moninder Bansal, Senior Manager, Corporate Applications Engineering, Synopsys
Jun 11, 2014
|VCS Xprop: Catch X-Related Issues at RTL to Reduce Time-Consuming Gate-Level Simulations|
In this webinar you'll learn about a new technology in VCS, called Xprop, which eliminates 'x' optimism at RTL to enable correlation with hardware design behavior. Xprop can be used to reduce and potentially eliminate gate-level simulations for 'x' validation. This webinar will also show how VCS® Xprop eliminates 'x' optimism in advanced simulation flows (such as VCS-NLP) and demonstrate how to debug 'x'-related issues identified by VCS-NLP and Xprop using Verdi™ Power-Aware Debug.
Rebecca Lipon, Senior Product Marketing Manager, Verification Group, Synopsys
Nov 05, 2013
|Verilog-to-Verilog Equivalence Checking Using ESP|
This Webinar gives a quick introduction to ESP-CV and how recent features are used to verify various Verilog-to-Verilog scenarios. Coverage analysis of the results is also discussed.
Philip Schmidt, R&D Manager, Synopsys; Dave Hedges, Corporate Applications Engineer, Synopsys
May 29, 2013