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Before starting mass production of a new optical system, or even small-scale production, it is essential to validate the system with an accurate prototype.
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With the powerful optical design software tools available today from the Synopsys Optical Solutions, we can create virtual prototypes of complex models to analyze physical properties. These prototypes can vary from micro-optics to large complete systems.
Optical models for scientific and industrial applications require precise material measurements to achieve realistic simulations. This involves characterizing optical properties to predict light-material interactions accurately.
Additionally, computational techniques such as ray tracing, beam propagation, and Maxwell’s equation solvers model the intricate behavior of light and the light-matter interaction. These methods require significant computational resources but provide highly detailed and accurate results. This level of precision is crucial for designing optical systems, developing new materials, and improving manufacturing processes.
As a result, virtual prototyping is increasingly playing a critical role in validating and refining new optical products before they reach production.
Integrating Bidirectional Scattering Distribution Function (BSDF) measurements in virtual prototypes helps engineers create reliable, high-quality optical products that meet technology demands. BSDF describes the complete scattering behavior as a function of source incident angle and wavelength:
In practice, this phenomenon is usually split into reflected and transmitted components, which are then treated separately as BRDF (Bidirectional Reflectance Distribution Function) and BTDF (Bidirectional Transmittance Distribution Function).
The following image shows the link between the roughness of a material and light reflection. By measuring the direction of the reflected light and obtaining the BSDF value, we can accurately model the roughness of a surface.
Link between the roughness of a material, the associated BRDF component, and visualization of the material.
These are a few examples of how BSDF data can be used to enhance optical product modeling:
Synopsys provides a variety of solutions to help you integrate BSDF measurements into your virtual prototypes. Using our optical scattering instruments or on-demand measurement services, you can quickly obtain precise data for any optical surface or material.
Synopsys scattering measurement instruments: Mini-Diff VPro, REFLET 180S and Mini-Diff V2
The ImSym – Imaging System Simulator software product transforms the way optical engineers design and validate imaging systems by providing an end-to-end, physically accurate virtual prototype. ImSym models the entire imaging chain, including the optics, sensor, and image processing pipeline. This system-level approach provides an integrated view of the system's performance with simulations that translate into production-ready designs.
ImSym simulation workflow
As illustrated in the following example, BSDF measurements can be incorporated into ImSym simulations to obtain precise visualizations of how light behaves when it interacts with surfaces and materials in the imaging system model.
In modern factories, cameras are used with machine vision technology to inspect products and detect minute flaws and inconsistencies. Virtually prototyping machine vision optics can help evaluate factors such as determining the required camera speed to meet requirements, or troubleshooting unwanted stray light that is reaching the image sensor.
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In this example, we want to simulate a machine vision camera that will be used to inspect a printed circuit board (PCB). The ImSym workflow to perform the machine vision camera simulation includes the following steps:
Diagram of ImSym simulation steps to reach the final detector image
Source of the scene object: “Gold plated printed circuit board.” Wikimedia Commons
The following figure shows the initial ImSym simulation of the machine vision camera. Some holes in the PCB are circled in red, which indicates that they were successfully detected. Those that were not successfully detected remain without red circles. The specular reflection of the copper on the PCB leads to saturated pixels in the camera, preventing the detection of the holes. This oversaturation occurs because the highly reflective surface of the copper creates intense glare, which overwhelms the camera sensor. Consequently, critical features such as holes are obscured and cannot be accurately identified.
Initial ImSym simulation result
One way to address this issue is to include an optical scattering measurement of the green PCB and copper in the ImSym simulation, which provides a more realistic view of the interaction between light and the PCB. The simulation can account for both specular and diffuse reflections, providing a comprehensive representation of how light behaves when it encounters the copper surface. This will give you additional insights so that you can also adjust the detector and ISP model used in ImSym to improve detection of PCB details.
You can use the Synopsys Mini-Diff V2 instrument to obtain the BSDF data.
Synopsys Mini-Diff V2 can be linked to a computer when measuring the optical scattering properties of the PCB; results are instantly available to include in the ImSym model
Following are the measurement results obtained for the copper portion of the PCB:
Left: BRDF perspective view of the copper for an incident angle of 20° and the 630nm wavelength; Right: RGB view of the copper for an incident angle of 20°
The copper reflection is not purely specular; there is also a diffusion around the peak. This indicates that the reflective properties of the copper surface are more complex than initially anticipated.
The specular reflection, which is the mirror-like reflection of light, is accompanied by a diffuse component that scatters light in various directions. This scattering can affect the accuracy of detecting features, such as holes on the PCB, since the diffused light may obscure or blur the details that need to be identified.
Adding the BSDF data measured by the Mini-Diff V2 to the ImSym model and adjusting the detector and ISP parameters helps to mitigate issues related to oversaturation and enhances the ability of the optical system to detect fine details on the PCB. As a result, the inspection process is significantly more accurate and reliable, leading to better quality control and more reliable PCB manufacturing. The updated ImSym simulation is shown below, in which all the PCB holes are detected.
ImSym simulation after including BSDF data and adjusting detector and ISP model parameters
Understanding and accounting for both the specular and diffuse components of the reflection are crucial for improving the detection algorithms and ensuring precise inspection of the PCB.
ImSym allows engineers to model virtual prototypes of optical systems, providing early warnings of issues and enabling direct testing of image quality and signal processing. This proactive approach saves time and reduces costs by identifying problems early.
ImSym models the entire image acquisition chain and can use component models of varying fidelity. Synopsys optical scattering instruments measure BSDF, precisely describing light interactions with materials. Integrating measured data into ImSym creates an increased level of realism for reliable virtual prototypes, or virtual twins, closely mirroring the physical prototype.